X-RAY MICROSCOPY SEMINAR & WORKSHOP
Wednesday, October 30, 2019 @ Rigaku Americas Corporation
We discussed image segmentation by deep learning, the application of X-ray CT to study surface phenomena, and the keys to X-ray CT measurements of lightly-absorbing materials in this seminar.
Image Analysis in MicroCT - Transformative Advances in Deep Learning
Mike Marsh | Dragonfly Product Manager | Object Research Systems
High-Resolution X-ray CT for Low Z Materials
Aya Takase | Rigaku Americas Corporation
X-ray Microscopy in Analysis of Surface Phenomena
Kostya Kornev | Clemson University